@article{exploringmanyinfewandfewinmanyproperties,
  title = {Exploring "Many in Few" and "Few in Many" Properties in Long-Tailed, Highly-Imbalanced IC Defect Classification},
  author = {Hao-Chiang Shao and Chun-Hao Chang and Yu-Hsien Lin and Chia-Wen Lin and Shao-Yun Fang and Yan-Hsiu Liu},
  year = {2025},
  eprint = {2510.19463},
  archivePrefix = {arXiv},
  url = {https://arxiv.org/abs/2510.19463},
}