@article{jointdatarateandemfexposureanalysisin1,
  title = {Joint data rate and EMF exposure analysis in Manhattan environments: stochastic geometry and ray tracing approaches},
  author = {Charles Wiame and Simon Demey and Luc Vandendorpe and Philippe De Doncker and Claude Oestges},
  year = {2023},
  eprint = {2301.11097},
  archivePrefix = {arXiv},
  url = {https://arxiv.org/abs/2301.11097v1},
}