@article{machinelearningtechniquesforidentifying,
  title = {Observational and Experimental Insights into Machine Learning-Based Defect Classification in Wafers},
  author = {Kamal Taha},
  year = {2023},
  eprint = {2310.10705},
  archivePrefix = {arXiv},
  url = {https://arxiv.org/abs/2310.10705v4},
}