@article{semiconductorwafermapdefectclassificatio,
  title = {Semiconductor Wafer Map Defect Classification with Tiny Vision Transformers},
  author = {Faisal Mohammad and Duksan Ryu},
  year = {2025},
  eprint = {2504.02494},
  archivePrefix = {arXiv},
  url = {https://arxiv.org/abs/2504.02494v1},
}