@article{simiccontextawaresiliconmicrostructurech,
  title = {SiMiC: Context-Aware Silicon Microstructure Characterization Using Attention-Based Convolutional Neural Networks for Field-Emission Tip Analysis},
  author = {Jing Jie Tan and Rupert Schreiner and Matthias Hausladen and Ali Asgharzade and Simon Edler and Julian Bartsch and Michael Bachmann and Andreas Schels and Ban-Hoe Kwan and Danny Wee-Kiat Ng and Yan-Chai Hum},
  year = {2026},
  eprint = {2601.17048},
  archivePrefix = {arXiv},
  url = {https://arxiv.org/abs/2601.17048},
}