@article{wafermapdefectclassificationusing,
  title = {Wafer Map Defect Classification Using Autoencoder-Based Data Augmentation and Convolutional Neural Network},
  author = {Yin-Yin Bao and Er-Chao Li and Hong-Qiang Yang and Bin-Bin Jia},
  year = {2024},
  eprint = {2411.11029},
  archivePrefix = {arXiv},
  url = {https://arxiv.org/abs/2411.11029v1},
}