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HiSin: Efficient High-Resolution Sinogram Inpainting via Resolution-Guided Progressive Inference

High-resolution sinogram inpainting is essential for computed tomography reconstruction, as missing high-frequency projections can lead to visible artifacts and diagnostic errors. Diffusion models are well-suited for this task due to their robustness and detail-preserving capabilities, but their application to high-resolution inputs is limited by excessive memory and computational demands. To address this limitation, we propose HiSin, a novel diffusion based framework for efficient sinogram inpainting via resolution-guided progressive inference. It progressively extracts global structure at low resolution and defers high-resolution inference to small patches, enabling memory-efficient inpainting. It further incorporates frequency-aware patch skipping and structure-adaptive step allocation to reduce redundant computation. Experimental results show that HiSin reduces peak memory usage by up to 31.25% and inference time by up to 18.15%, and maintains inpainting accuracy across datasets, resolutions, and mask conditions.

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