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Scanning diffraction imaging without stable illumination and scan position information

Ptychography has become prominent at synchrotron facilities worldwide for characterizing biological and material specimens' topological structures and properties at the nanometer or atomic scale, due to its lens - less, highly quantitative phase imaging. Its high - resolution imaging depends on accurate lateral scan position info, a large overlap ratio, and a stable probe function. But as research moves to atomic scales, meeting these requirements gets harder, often needing high - precision motion control and manual pre - calibration. This paper presents a new imaging framework. By adding a wavefront modulator and a new phase retrieval workflow, it removes the strict requirements of traditional ptychography. Significantly, our method doesn't need pre - calibration of the wavefront modulator. Optical validation showed the deviation between the recovered position and a top - tier motion stage was less than 10 nm. Sub - pixel position accuracy was achievable even with a 13% overlap ratio. In an X - ray experiment with a spatially unstable probe violating the ptychographic model and an 18% overlap ratio, our method simultaneously and quantitatively retrieved beam spatial deviation, scan position, probe function, and sample transmission function. Notably, it measured probe spatial deviations of 500nm along the X - axis and 50nm along the Y - axis, which is not feasible by previous methods. With these experimentally proven advantages, we anticipate our method to be a powerful imaging tool with auto - quantitative calibration of various parameters. It will simplify scanning diffraction microscopy implementation and expand its application scope, especially in nanometer and atomic scale imaging.

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