paper-with-me

Papers

(SimPhon Speech Test): A Data-Driven Method for In Silico Design and Validation of a Phonetically Balanced Speech Test

2025-06-13 · Stefan Bleeck

Traditional audiometry often provides an incomplete characterization of the functional impact of hearing loss on speech understanding, particularly for supra-threshold deficits common in presbycusis. This motivates the development of more diagnostically specific speech perception tests. We introduce the Simulated Phoneme Speech Test (SimPhon Speech Test) methodology, a novel, multi-stage computational pipeline for the in silico design and validation of a phonetically balanced minimal-pair speech test. This methodology leverages a modern Automatic Speech Recognition (ASR) system as a proxy for a human listener to simulate the perceptual effects of sensorineural hearing loss. By processing speech stimuli under controlled acoustic degradation, we first identify the most common phoneme confusion patterns. These patterns then guide the data-driven curation of a large set of candidate word pairs derived from a comprehensive linguistic corpus. Subsequent phases involving simulated diagnostic testing, expert human curation, and a final, targeted sensitivity analysis systematically reduce the candidates to a final, optimized set of 25 pairs (the SimPhon Speech Test-25). A key finding is that the diagnostic performance of the SimPhon Speech Test-25 test items shows no significant correlation with predictions from the standard Speech Intelligibility Index (SII), suggesting the SimPhon Speech Test captures perceptual deficits beyond simple audibility. This computationally optimized test set offers a significant increase in efficiency for audiological test development, ready for initial human trials.

📄 PDF Abstract BibTeX arXiv:2506.11620

Code (0)

등록된 구현이 없습니다.

Tasks

Automatic Speech RecognitionAutomatic Speech Recognition (ASR)Diagnosticspeech-recognitionSpeech Recognition

Methods 이 논문이 사용한 방법론

SET Dynamic Sparse Training method where weight mask is updated randomly periodically

Similar Papers 제목 키워드 기반

SimPhony: A Device-Circuit-Architecture Cross-Layer Modeling and Simulation Framework for Heterogeneous Electronic-Photonic AI System

2024-11-20 · Ziang Yin, Meng Zhang, Amir Begovic, Rena Huang 외

Electronic-photonic integrated circuits (EPICs) offer transformative potential for next-generation high-performance AI but require interdisciplinary advances across devices, circuits, architecture, and design automation.…

Structured Testbench Generation for LLM-Driven HDL Design and Verification-Oriented Data Curation

2026-06-11 · En-Ming Huang, Yu-Hung Kao, Ren-Hao Deng, Wei-Po Hsin 외 arxiv

Automated testbench generation has become a critical bottleneck in large language model (LLM)-driven Register Transfer Level (RTL) workflows, where large numbers of candidate designs must be verified rapidly and reliably…

SiliconMind-V1: Multi-Agent Distillation and Debug-Reasoning Workflows for Verilog Code Generation

2026-02-10 · Mu-Chi Chen, Yu-Hung Kao, Po-Hsuan Huang, Shao-Chun Ho 외 arxiv

Large language models (LLMs) have recently emerged as a promising approach for automating Verilog code generation; however, existing methods primarily emphasize syntactic correctness and often rely on commercial models o…

Code Generation

Discovering Mechanistic Models of Neural Activity: System Identification in an in Silico Zebrafish

2026-02-04 · Jan-Matthis Lueckmann, Viren Jain, Michał Januszewski arxiv

Constructing mechanistic models of neural circuits is a fundamental goal of neuroscience, yet verifying such models is limited by the lack of ground truth. To rigorously test model discovery, we establish an in silico te…

Experts in the Loop: Conditional Variable Selection for Accelerating Post-Silicon Analysis Based on Deep Learning

2022-09-30 · Yiwen Liao, Raphaël Latty, Bin Yang

Post-silicon validation is one of the most critical processes in modern semiconductor manufacturing. Specifically, correct and deep understanding in test cases of manufactured devices is key to enable post-silicon tuning…

Variable Selection