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Human Perception-Inspired Grain Segmentation Refinement Using Conditional Random Fields

Automated detection of grain boundaries in electron microscope images of polycrystalline materials could help accelerate the nanoscale characterization of myriad engineering materials and novel materials under scientific research. Accurate segmentation of interconnected line networks, such as grain boundaries in polycrystalline material microstructures, poses a significant challenge due to the fragmented masks produced by conventional computer vision algorithms, including convolutional neural networks. These algorithms struggle with thin masks, often necessitating post-processing for effective contour closure and continuity. Previous approaches in this domain have typically relied on custom post-processing techniques that are problem-specific and heavily dependent on the quality of the mask obtained from a computer vision algorithm. Addressing this issue, this paper introduces a fast, high-fidelity post-processing technique that is universally applicable to segmentation masks of interconnected line networks. Leveraging domain knowledge about grain boundary connectivity, this method employs conditional random fields and perceptual grouping rules to refine segmentation masks of any image with a discernible grain structure. This approach significantly enhances segmentation mask accuracy, achieving a 79% segment identification accuracy in validation with a U-Net model on electron microscopy images of a polycrystalline oxide. Additionally, a novel grain alignment metric is introduced, showing a 51% improvement in grain alignment. This method not only enables rapid and accurate segmentation but also facilitates an unprecedented level of data analysis, significantly improving the statistical representation of grain boundary networks, making it suitable for a range of disciplines where precise segmentation of interconnected line networks is essential.

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