paper-with-me

홈 › Papers

Benchmarks as Microscopes: A Call for Model Metrology

2024-07-22 · Michael Saxon, Ari Holtzman, Peter West, William Yang Wang, Naomi Saphra

Modern language models (LMs) pose a new challenge in capability assessment. Static benchmarks inevitably saturate without providing confidence in the deployment tolerances of LM-based systems, but developers nonetheless claim that their models have generalized traits such as reasoning or open-domain language understanding based on these flawed metrics. The science and practice of LMs requires a new approach to benchmarking which measures specific capabilities with dynamic assessments. To be confident in our metrics, we need a new discipline of model metrology -- one which focuses on how to generate benchmarks that predict performance under deployment. Motivated by our evaluation criteria, we outline how building a community of model metrology practitioners -- one focused on building tools and studying how to measure system capabilities -- is the best way to meet these needs to and add clarity to the AI discussion.

📄 PDF Abstract BibTeX arXiv:2407.16711

Code (0)

등록된 구현이 없습니다.

Tasks

Benchmarkingmodel

Similar Papers 제목 키워드 기반

Metrology for AI: From Benchmarks to Instruments

2019-11-05 · Chris Welty, Praveen Paritosh, Lora Aroyo

In this paper we present the first steps towards hardening the science of measuring AI systems, by adopting metrology, the science of measurement and its application, and applying it to human (crowd) powered evaluations.…

Word Similarity

Interpretation of Confocal ISO 21073: 2019 confocal microscopes: Optical data of fluorescence confocal microscopes for biological imaging- Recommended Methodology for Quality Control

2020-11-17 · Glyn Nelson, Laurent Gelman, Orestis Faklaris, Roland Nitschke 외

The performance of a confocal imaging system may be no better than a general-purpose widefield system if it is not properly maintained or quality controlled. The publication of ISO 21073, 'Confocal microscopes- Optical d…

Beyond Heisenberg Limit Quantum Metrology through Quantum Signal Processing

2022-09-22 · Yulong Dong, Jonathan Gross, Murphy Yuezhen Niu

Leveraging quantum effects in metrology such as entanglement and coherence allows one to measure parameters with enhanced sensitivity. However, time-dependent noise can disrupt such Heisenberg-limited amplification. We p…

Model-based interfacing of large-scale metrology instruments

2020-01-16

Metrology assisted assembly systems constitute cyber physical production systems relying on in-process sensor data as input to model-based control loops. These range from local, physical control loops, e.g. for robots to…

Managementmodel

Trustworthy Artificial Intelligence in the Context of Metrology

2024-06-14 · Tameem Adel, Sam Bilson, Mark Levene, Andrew Thompson

We review research at the National Physical Laboratory (NPL) in the area of trustworthy artificial intelligence (TAI), and more specifically trustworthy machine learning (TML), in the context of metrology, the science of…

Uncertainty Quantification